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Figure 3
Comparison between the (a) measured XRD intensities, (b) corresponding partial structure factor SGaGa(Q) and (c) partial PDF gGaGa(r) for liquid Ga at ∼0.1 GPa in the new HXD95 device (black curve) and the externally heated cell (RH-DAC) available on I15 (Drewitt et al., 2018BB32) (red curve). For clarity, the HXD95 measurement has been displaced vertically.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 27| Part 2| March 2020| Pages 529-537
https://doi.org/10.1107/S1600577519016801
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