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![[Figure 1]](fv5108fig1mag.jpg)
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Figure 1
Schematic of the ptychographic measurement system installed with AKB mirrors as a focusing device at the SPring-8 BL29XUL beamline. The experimental hutch has a temperature feedback system to suppress the temperature drift to less than 0.05 K. The distance between the center of the downstream hyperbolic mirror and the focal point is 0.50 m. The working distance is 0.45 m. The AKB mirror unit is purged with He gas. To monitor the intensity of the incident X-rays, an ion chamber is placed between the mirror and the sample. Diffraction intensities are normalized by the incident flux at each scan position. The sample is mounted on nanopositioning piezoelectric stages in a vacuum chamber with less than 0.1 Pa pressure. A semitransparent Si beamstop is placed in front of the detector. The diffraction patterns are measured by a pixelated detector (EIGER 1M) placed 2.2 m downstream of the sample plane. |
![[Figure 1]](fv5108fig1.jpg)
 | JOURNAL OF SYNCHROTRON RADIATION |
ISSN: 1600-5775
