view article

Figure 1
(a) The measurement configuration for the optical characterization of a lens in transmission. The detector is fixed at all times. (b) The configuration for the optical characterization of a mirror upon reflection. Here, the detector can be moved transverse to the beam propagation direction between scans, in order to intercept the reflected X-ray beam.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Follow J. Synchrotron Rad.
Sign up for e-alerts
Follow J. Synchrotron Rad. on Twitter
Follow us on facebook
Sign up for RSS feeds