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Figure 3
An illustration of the origin of the Γ factor for the case of a diverging source and a speckle generator located upstream of the sample. The photon deflection angle induced by refraction in the sample is represented by α (located in the sample plane). When the displacement vector corresponds to the vector illustrated by υ1 (in the case of XSS) rather than υ2 located on the detector (for instance with XST or XSVT), one must scale the displacement vector by a Γ factor to recover α through the relationship linking the angles: α = β + ζ. Equivalent considerations can be used when employing a setup where the speckle generator is placed after the sample.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 27| Part 2| March 2020| Pages 284-292
https://doi.org/10.1107/S1600577520000491
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