view article

Figure 2
(a) Averaged threshold scans obtained during detector characterization in the laboratory with the high-gain configuration for the right chip. (b) Linear fits to obtain the energy calibration for the high-gain configuration for both chips (the two fits for the low/high discriminator overlap). (c) Energy resolution obtained from the threshold scans for the left chip.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Follow J. Synchrotron Rad.
Sign up for e-alerts
Follow J. Synchrotron Rad. on Twitter
Follow us on facebook
Sign up for RSS feeds