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Figure 6
Edge scan over the Se edge on a 90 µm × 50 µm crystal showing a comparison between JUNGFRAU and an SDD measurement.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 27| Part 2| March 2020| Pages 329-339
https://doi.org/10.1107/S1600577519016758
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