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Figure 5
Schematic diagram of the calibration process for the angle divergence of the brush beam and the lattice inhomogeneity of the MDCM. A slit of width 0.5 mm installed in front of the sample is used for scanning horizontally along the beam. The sample is rotated at each position and the d-spacing is measured at the same point on the sample by using the beam at different horizontal positions of the brush beam. Finally, based on this measurement, the measurement results of the brush beam are corrected.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 27| Part 3| May 2020| Pages 577-582
https://doi.org/10.1107/S1600577520001496
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