High-efficiency ultra-precision comparator for d-spacing mapping measurement of silicon

Yang, J.; Li, T.; Zhu, Y.; Zhang, X.; Waseda, A.; Fujimoto, H.

doi:10.1107/S1600577520001496

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

IUCr IT WDC

home archive editors for authors for readers submit subscribe open access

view article

Figure 7
Measurements on a monocrystalline silicon sample 9.R1 using the improved SRLC, where the spatial resolution is 0.5 mm × 0.5 mm. (a) Raw data from the measurement by the brush-beam mapping. (b) The result after correction.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 27| Part 3| May 2020| Pages 577-582

https://doi.org/10.1107/S1600577520001496

Follow J. Synchrotron Rad.

Search IUCr Journals		doi		Advanced search
Author		volume	page