Soft X-ray diffraction patterns measured by a LiF detector with sub-micrometre resolution and an ultimate dynamic range

Makarov, S.; Pikuz, S.; Ryazantsev, S.; Pikuz, T.; Buzmakov, A.; Rose, M.; Lazarev, S.; Senkbeil, T.; von Gundlach, A.; Stuhr, S.; Rumancev, C.; Dzhigaev, D.; Skopintsev, P.; Zaluzhnyy, I.; Viefhaus, J.; Rosenhahn, A.; Kodama, R.; Vartanyants, I.A.

doi:10.1107/S1600577520002192

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Figure 1
Principle of the operation with a LiF detector. (a) Irradiation of a LiF crystal by ionizing radiation with an energy above 14 eV. (b) Visualization of a CCs distribution into a LiF volume using an optical system with excitation light (e.g. an optical microscope in fluorescent mode) (c) Absorption and emission bands for F₂ and F₃⁺ CCs in the LiF crystal. (d) Steps of the readout procedure via confocal fluorescence microscope for determining the dose accumulated in the LiF detector.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 27| Part 3| May 2020| Pages 625-632

https://doi.org/10.1107/S1600577520002192

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