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Figure 2
Two cases of the experimental setup. (a) The X-ray beam propagated through the slit and its profile was measured alternatively by the LiF crystal detector or the pre-calibrated photodiode. (b) Scanning of the intensity distribution of the X-ray beam propagated through both the slit and the pinhole in different planes along the Z axis using the LiF crystal detector.

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ISSN: 1600-5775
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