Soft X-ray diffraction patterns measured by a LiF detector with sub-micrometre resolution and an ultimate dynamic range

Makarov, S.; Pikuz, S.; Ryazantsev, S.; Pikuz, T.; Buzmakov, A.; Rose, M.; Lazarev, S.; Senkbeil, T.; von Gundlach, A.; Stuhr, S.; Rumancev, C.; Dzhigaev, D.; Skopintsev, P.; Zaluzhnyy, I.; Viefhaus, J.; Rosenhahn, A.; Kodama, R.; Vartanyants, I.A.

doi:10.1107/S1600577520002192

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Figure 2
Two cases of the experimental setup. (a) The X-ray beam propagated through the slit and its profile was measured alternatively by the LiF crystal detector or the pre-calibrated photodiode. (b) Scanning of the intensity distribution of the X-ray beam propagated through both the slit and the pinhole in different planes along the Z axis using the LiF crystal detector.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 27| Part 3| May 2020| Pages 625-632

https://doi.org/10.1107/S1600577520002192

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