Soft X-ray diffraction patterns measured by a LiF detector with sub-micrometre resolution and an ultimate dynamic range

Makarov, S.; Pikuz, S.; Ryazantsev, S.; Pikuz, T.; Buzmakov, A.; Rose, M.; Lazarev, S.; Senkbeil, T.; von Gundlach, A.; Stuhr, S.; Rumancev, C.; Dzhigaev, D.; Skopintsev, P.; Zaluzhnyy, I.; Viefhaus, J.; Rosenhahn, A.; Kodama, R.; Vartanyants, I.A.

doi:10.1107/S1600577520002192

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Figure 6
A sequence of PL images obtained on the surface of the LiF detector in different planes z [(a), (d) and (g)]. Plane-wave simulations for the propagation of the wavefield from a 5 µm pinhole aperture are shown in (b), (e) and (h). The dose distribution along the dashed white lines for experimental (black) and simulated (red) data are shown in (c), (f) and (i).

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 27| Part 3| May 2020| Pages 625-632

https://doi.org/10.1107/S1600577520002192

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