TEXS: in-vacuum tender X-ray emission spectrometer with 11 Johansson crystal analyzers

Rovezzi, M.; Harris, A.; Detlefs, B.; Bohdan, T.; Svyazhin, A.; Santambrogio, A.; Degler, D.; Baran, R.; Reynier, B.; Noguera Crespo, P.; Heyman, C.; Van Der Kleij, H.-P.; Van Vaerenbergh, P.; Marion, P.; Vitoux, H.; Lapras, C.; Verbeni, R.; Kocsis, M.M.; Manceau, A.; Glatzel, P.

doi:10.1107/S160057752000243X

Journal of Synchrotron Radiation Journal of
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Figure 1
Bragg angular range required to continuously cover the tender X-ray range with β-SiO₂(100), Si(111) and Si(220) reflections. The elements and corresponding energies of three selected families of emission lines, namely Kα₁, Lα₁ and Mα₁, are indicated in the top axes. The horizontal lines indicate the angular range covered by the spectrometer.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 27| Part 3| May 2020| Pages 813-826

https://doi.org/10.1107/S160057752000243X

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