TEXS: in-vacuum tender X-ray emission spectrometer with 11 Johansson crystal analyzers

Rovezzi, M.; Harris, A.; Detlefs, B.; Bohdan, T.; Svyazhin, A.; Santambrogio, A.; Degler, D.; Baran, R.; Reynier, B.; Noguera Crespo, P.; Heyman, C.; Van Der Kleij, H.-P.; Van Vaerenbergh, P.; Marion, P.; Vitoux, H.; Lapras, C.; Verbeni, R.; Kocsis, M.M.; Manceau, A.; Glatzel, P.

doi:10.1107/S160057752000243X

Journal of Synchrotron Radiation Journal of
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Figure 4
Results of the ray-tracing study for a Si CBJCA of 25 mm × 80 mm size plus an elliptical fluorescence source size of 0.1 mm × 0.5 mm. The tabulated width of the emission lines for all the elements accessible in the given energy range are shown for comparison (symbols). The top scales give the corresponding Bragg angle for Si(111) and Si(220) reflections.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 27| Part 3| May 2020| Pages 813-826

https://doi.org/10.1107/S160057752000243X

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