TEXS: in-vacuum tender X-ray emission spectrometer with 11 Johansson crystal analyzers

Rovezzi, M.; Harris, A.; Detlefs, B.; Bohdan, T.; Svyazhin, A.; Santambrogio, A.; Degler, D.; Baran, R.; Reynier, B.; Noguera Crespo, P.; Heyman, C.; Van Der Kleij, H.-P.; Van Vaerenbergh, P.; Marion, P.; Vitoux, H.; Lapras, C.; Verbeni, R.; Kocsis, M.M.; Manceau, A.; Glatzel, P.

doi:10.1107/S160057752000243X

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 9
Spectrometer resolution function de-convoluted from the measured emission lines (symbols) and compared with the expected performances simulated with ray tracing (lines).

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 27| Part 3| May 2020| Pages 813-826

https://doi.org/10.1107/S160057752000243X

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