Development of a scanning soft X-ray spectromicroscope to investigate local electronic structures on surfaces and interfaces of advanced materials under conditions ranging from low vacuum to helium atmosphere

Oura, M.; Ishihara, T.; Osawa, H.; Yamane, H.; Hatsui, T.; Ishikawa, T.

doi:10.1107/S1600577520002258

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 1
(a) Top-view schematic for the scanning soft X-ray spectromicroscope, where TMP is the turbo-molecular pump, FRG the full-range gauge, FZP the Fresnel zone plate, OSA the order-sorting aperture, SDD the silicon drift detector and SR the synchrotron radiation. (b, c, d) Photographs of the present apparatus: (b) the view from downstream, (c) the view from upstream, and (d) the area around the sample.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 27| Part 3| May 2020| Pages 664-674

https://doi.org/10.1107/S1600577520002258

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