Development of a scanning soft X-ray spectromicroscope to investigate local electronic structures on surfaces and interfaces of advanced materials under conditions ranging from low vacuum to helium atmosphere

Oura, M.; Ishihara, T.; Osawa, H.; Yamane, H.; Hatsui, T.; Ishikawa, T.

doi:10.1107/S1600577520002258

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

IUCr IT WDC

home archive editors for authors for readers submit subscribe open access

view article

Figure 2
(a) Two-dimensional map of the transmitted SX-beam intensity by scanning the OSA XZ-positions recorded using the photodiode downstream of the SiN window. (b, c) One-dimensional scan profiles of X- and Z-axes of the OSA.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 27| Part 3| May 2020| Pages 664-674

https://doi.org/10.1107/S1600577520002258

Follow J. Synchrotron Rad.

Search IUCr Journals		doi		Advanced search
Author		volume	page