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Figure 3
(a) Intensity profile measured by scanning the knife-edge for the Z-axis and its derivative showing the width of the focused SX beam at the FZP-Y-axis position of −20420 µm. (b) Correlation map between the FZP-Y-axis position and the SX-beam profile. (c) Deduced FWHM of the SX-beam profile as a function of the FZP-Y-axis position. |