Development of a scanning soft X-ray spectromicroscope to investigate local electronic structures on surfaces and interfaces of advanced materials under conditions ranging from low vacuum to helium atmosphere

Oura, M.; Ishihara, T.; Osawa, H.; Yamane, H.; Hatsui, T.; Ishikawa, T.

doi:10.1107/S1600577520002258

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 3
(a) Intensity profile measured by scanning the knife-edge for the Z-axis and its derivative showing the width of the focused SX beam at the FZP-Y-axis position of −20420 µm. (b) Correlation map between the FZP-Y-axis position and the SX-beam profile. (c) Deduced FWHM of the SX-beam profile as a function of the FZP-Y-axis position.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 27| Part 3| May 2020| Pages 664-674

https://doi.org/10.1107/S1600577520002258

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