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Figure 4
(a) Photograph of the patterned sample, taken using a metallurgical microscope. The micro-dot patterns made of permalloy (Ni81Fe19) were fabricated on the silicon substrate. (b) The SX-induced fluorescence spectra recorded inside the micro-dot (red-curve, point B) and outside the micro-dot (blue-curve, point A). (c) Element-specific two-dimensional mapping measured by counting the number of Fe Lα X-rays.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 27| Part 3| May 2020| Pages 664-674
https://doi.org/10.1107/S1600577520002258
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