Development of a scanning soft X-ray spectromicroscope to investigate local electronic structures on surfaces and interfaces of advanced materials under conditions ranging from low vacuum to helium atmosphere

Oura, M.; Ishihara, T.; Osawa, H.; Yamane, H.; Hatsui, T.; Ishikawa, T.

doi:10.1107/S1600577520002258

Journal of Synchrotron Radiation Journal of
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Figure 5
(a) Element-specific two-dimensional mapping measured using a 760 eV SX beam. (b) Micro-XAFS recorded inside the micro-dot (red-curve, point A) and outside the micro-dot (blue-curve, point B) by sweeping the SX-beam energy around the Fe L_2, 3-edges.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 27| Part 3| May 2020| Pages 664-674

https://doi.org/10.1107/S1600577520002258

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