Development of a scanning soft X-ray spectromicroscope to investigate local electronic structures on surfaces and interfaces of advanced materials under conditions ranging from low vacuum to helium atmosphere

Oura, M.; Ishihara, T.; Osawa, H.; Yamane, H.; Hatsui, T.; Ishikawa, T.

doi:10.1107/S1600577520002258

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 6
Results from the feasibility study for electron collection using the OSA. The line with blue open-circles indicates the profile of the 720 eV SX beam measured by scanning the knife-edge for the Z-axis using a photodiode. The line with red filled-circles shows the profile of the photocurrent intensity measured along the Z-axis of the surface of the knife-edge.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 27| Part 3| May 2020| Pages 664-674

https://doi.org/10.1107/S1600577520002258

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