Full strain tensor measurements with X-ray diffraction and strain field mapping: a simulation study

Tang, M.X.; Huang, J.W.; E, J.C.; Zhang, Y.Y.; Luo, S.N.

doi:10.1107/S1600577520003926

Journal of Synchrotron Radiation Journal of
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Figure 5
Diffraction analysis with full and partial diffraction rings. For the latter, χ spans over 0–45° and 315°–360°. (a) Full diffraction rings of tantalum under uniaixal strain compression (∊_xx = 0.08), and (b) corresponding partial diffraction rings. White curves: deformed (D); black curves: undeformed (U). (c) d_m versus $[(1-3\cos^{2}{\theta})]$ plot for the full {110} diffraction ring. Red dots: `data;' black line: linear fitting. (d) Comparison of the d_m versus $[(1-3\cos^{2}{\theta})]$ plots for fitting with full (black curve) and partial (green) {110} diffraction rings.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 27| Part 3| May 2020| Pages 646-652

https://doi.org/10.1107/S1600577520003926

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