Full strain tensor measurements with X-ray diffraction and strain field mapping: a simulation study

Tang, M.X.; Huang, J.W.; E, J.C.; Zhang, Y.Y.; Luo, S.N.

doi:10.1107/S1600577520003926

Journal of Synchrotron Radiation Journal of
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Figure 6
(a) Distribution of θ on the detector plane for the simulated geometry. (b) Fitting for the {110} diffraction ring with 45° ≤ χ ≤ 135°. (c) Fitting for the {110} diffraction ring with 0° ≤ χ ≤ 90°. Black and green lines: full and partial diffraction rings, respectively; red dots: `data.'

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 27| Part 3| May 2020| Pages 646-652

https://doi.org/10.1107/S1600577520003926

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