Full strain tensor measurements with X-ray diffraction and strain field mapping: a simulation study

Tang, M.X.; Huang, J.W.; E, J.C.; Zhang, Y.Y.; Luo, S.N.

doi:10.1107/S1600577520003926

Journal of Synchrotron Radiation Journal of
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Figure 7
{110} diffraction rings of nanocrystalline tantalum under (a) 1D-strain compression, (b) 1D-strain tension, (c) 1D-stress compression, and (d) 1D-stress tension loading. Black and white curves: fittings to simulated diffraction rings for the undeformed and deformed (∊_xx = 8.00%) cases, respectively.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 27| Part 3| May 2020| Pages 646-652

https://doi.org/10.1107/S1600577520003926

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