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Figure 2
(a) X-ray interference pattern and line profile obtained from a single shot of the monochromatic 15 keV XFEL beam. (b) Series of interference patterns and line profiles obtained from single-shot exposures carried out continuously. The peak position of fringes was fixed despite the variation in intensity and spatial distribution shot-by-shot. (c) Interference pattern obtained from a 10 s exposure (300 shots). A visibility of 60% was obtained despite the addition of 300 shots.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 27| Part 5| September 2020| Pages 1358-1361
https://doi.org/10.1107/S1600577520007778
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