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Figure 5
Correcting-time evolutions of the observed scattering intensity of Si (a) and Q[S(Q) − 1] of SiO2 (b) based on the OSS process. The axes of abscissa in (a) and (b) are 2θ and Q, respectively. The top panels display the uncorrected data. At the bottom of (a), the observed peaks are indicated by the primary index.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 27| Part 5| September 2020| Pages 1172-1179
https://doi.org/10.1107/S1600577520008929
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