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Figure 6
TFUs of the uncorrected and corrected scattering data of SiO2 as a function of observed scattering intensity. The corrected data is based on the 32 min correction by the OSS process. Channels from 14500 to 15000, which is shown in Fig. 3[link], were selected for evaluation. The TFU curve based on the Poisson noise is shown for comparison.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 27| Part 5| September 2020| Pages 1172-1179
https://doi.org/10.1107/S1600577520008929
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