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![[Figure 4]](co5147fig4mag.jpg)
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Figure 4
(a) In situ XRD data from the annealing of an SBN thin film on STO(100) plotted as diffracted intensity as a function of time, with the corresponding temperature in the right-hand panel. The colormap indicates the inverse hyperbolic sine (arcsinh) of the intensity to show all details in the intensity, especially with the strong (311) Bragg reflection for STO at 2θ = 38.65° at room temperature (λ = 0.780055 Å). (b) Summation of a room temperature ω scan covering 15° at two different detector heights, to minimize the detector gap in the data. The data show the polycrystalline nature of the thin film, where the Bragg reflections from the substrate are well confined in reciprocal space as seen from the small spread in azimuthal angle (η). A small degree of preferred orientation for SBN can be seen in the (411) peak at 2θ = 14.78° and η = 90°. (c) Rietveld refinement of the data set in (b), where the background has been subtracted. The refinement was done with March–Dollase (100) and (001) texture components and a starting model based on a Rietveld refinement of a powder data set measured on the calcined powder of the corresponding sol–gel. Details of the refinement can be found in the supporting information, Section S3.1.1. |
![[Figure 4]](co5147fig4.jpg)
 | JOURNAL OF SYNCHROTRON RADIATION |
ISSN: 1600-5775
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