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Figure 5
(a) In situ XRD data for a BTO thin film on an STO(100) substrate plotted as diffracted intensity as a function of time, with the corresponding temperature in the right-hand panel. The colormap indicates the inverse hyperbolic sine (arcsinh) of the intensity to show all details in the intensity. The intense peak for STO(311) is at 2θ = 38.82° (λ = 0.78242 Å) at room temperature. In the temperature versus time panel, the blue and orange bars show the time regions where BTO is polycrystalline and highly textured, respectively. (b) A data set measured at room temperature with the starting ω = 0°, Δω = 0.1° and 100 steps. In the top part all 100 steps have been summed, and in the bottom part each data set has been integrated without differing in η.

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SYNCHROTRON
RADIATION
ISSN: 1600-5775
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