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Figure 5
(a) In situ XRD data for a BTO thin film on an STO(100) substrate plotted as diffracted intensity as a function of time, with the corresponding temperature in the right-hand panel. The colormap indicates the inverse hyperbolic sine (arcsinh) of the intensity to show all details in the intensity. The intense peak for STO(311) is at 2θ = 38.82° (λ = 0.78242 Å) at room temperature. In the temperature versus time panel, the blue and orange bars show the time regions where BTO is polycrystalline and highly textured, respectively. (b) A data set measured at room temperature with the starting ω = 0°, Δω = 0.1° and 100 steps. In the top part all 100 steps have been summed, and in the bottom part each data set has been integrated without differing in η.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 27| Part 5| September 2020| Pages 1209-1217
https://doi.org/10.1107/S1600577520010140
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