Direct non-destructive total reflection X-ray fluorescence elemental determinations in zirconium alloy samples

Sanyal, K.; Kanrar, B.; Dhara, S.; Sibilia, M.; Sengupta, A.; Karydas, A.G.; Mishra, N.L.

doi:10.1107/S1600577520009364

Journal of Synchrotron Radiation Journal of
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Figure 5
Normalized GIXRF intensity profile of the Zr-2.5% Nb sample in the angular range 0–4.5° for (a) all the elements and (b) trace elements only.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 27| Part 5| September 2020| Pages 1253-1261

https://doi.org/10.1107/S1600577520009364

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