Soft X-ray absorption of thin films detected using substrate luminescence: a performance analysis

Piamonteze, C.; Windsor, Y.W.; Avula, S.R.V.; Kirk, E.; Staub, U.

doi:10.1107/S1600577520009972

Journal of Synchrotron Radiation Journal of
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Figure 2
(a) XAS and (b) XMCD at the Co edge for Co/Si₃N₄ measured in transmission (open circles) and Co/MgO measured using XEOL (line). The inset shows a magnification of the L₃-edge. (c) Sketch of the measurement setup for XEOL and transmission measurements.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 27| Part 5| September 2020| Pages 1289-1296

https://doi.org/10.1107/S1600577520009972

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