Soft X-ray absorption of thin films detected using substrate luminescence: a performance analysis

Piamonteze, C.; Windsor, Y.W.; Avula, S.R.V.; Kirk, E.; Staub, U.

doi:10.1107/S1600577520009972

Journal of Synchrotron Radiation Journal of
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Figure 7
(a) XAS data normalized at the L₂-edge. The legend shows the nominal thickness in nm / incidence angle in degrees. (b) XAS for left (red) and right (blue) circular polarization and (c) XMCD for the 80 nm-thick film at 60° incidence.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 27| Part 5| September 2020| Pages 1289-1296

https://doi.org/10.1107/S1600577520009972

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