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Figure 2
(a) Schematic of topography geometry of dislocation [\vec{AB}], which is divided into two mutually perpendicular components [\vec{AC}] and [\vec{CB}]. Two rays a and b of an incident X-ray beam meet the dislocation at its endpoints A and B. The v-axis of the uvw coordinate system is chosen to be parallel to [\vec{OP}]. Rays [\vec{AA_{n}}] and [\vec{BB_{n}}] diffract from dislocation endpoints A and B, resulting in diffraction images A1B1, A2B2, and A3B3. Similarly projected points Cn of point C are also drawn. The zero-length line segment A1B1 coinciding with point P is a special case, and generally no topograph is guaranteed to be there. (b) Top view of film f with three additional diffraction images A4B4, A5B5, and A6B6.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 27| Part 6| November 2020| Pages 1674-1680
https://doi.org/10.1107/S1600577520011248
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