Geometric determination of direction of dislocations using synchrotron X-ray transmission topography

Tuomi, T.O.; Lankinen, A.; Anttila, O.

doi:10.1107/S1600577520011248

Journal of Synchrotron Radiation Journal of
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Figure 5
Stereographic projection of poles (circles) corresponding to the topography pattern (rectangles) of a large (001) silicon wafer. Pole $[P^{\,{\prime}}]$ is a stereographic projection of the dislocation direction point P of Fig. 4

. Stereographic circle basic radius R = 60 mm. Two zones, $[[1\bar{1}\bar{2}]]$ and [001], are marked with dashed lines of their own type.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 27| Part 6| November 2020| Pages 1674-1680

https://doi.org/10.1107/S1600577520011248

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