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Figure 6
Diffraction pattern of transmission topographs of a silicon (001) wafer from the neck of a silicon crystal. The center of the incident X-ray beam image is defined as the origin O of the film. The film size is 101 mm × 126 mm.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 27| Part 6| November 2020| Pages 1674-1680
https://doi.org/10.1107/S1600577520011248
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