Backside-illuminated scientific CMOS detector for soft X-ray resonant scattering and ptychography

Desjardins, K.; Medjoubi, K.; Sacchi, M.; Popescu, H.; Gaudemer, R.; Belkhou, R.; Stanescu, S.; Swaraj, S.; Besson, A.; Vijayakumar, J.; Pautard, S.; Noureddine, A.; Mercère, P.; Da Silva, P.; Orsini, F.; Menneglier, C.; Jaouen, N.

doi:10.1107/S160057752001262X

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

IUCr IT WDC

home archive editors for authors for readers submit subscribe open access

view article

Figure 11
Radiation tolerance evaluation of (a) sCMOS GSENSE400BSI-TVISB and (b) sCMOS GENSE400BSI-GP by excess dark measurement after soft X-ray irradiation with a beam of 560, 1000 and 1600 eV and 80 eV, respectively. The dashed red curves are the empirical models [equation (5)

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 27| Part 6| November 2020| Pages 1577-1589

https://doi.org/10.1107/S160057752001262X

Follow J. Synchrotron Rad.

Search IUCr Journals		doi		Advanced search
Author		volume	page