Backside-illuminated scientific CMOS detector for soft X-ray resonant scattering and ptychography

Desjardins, K.; Medjoubi, K.; Sacchi, M.; Popescu, H.; Gaudemer, R.; Belkhou, R.; Stanescu, S.; Swaraj, S.; Besson, A.; Vijayakumar, J.; Pautard, S.; Noureddine, A.; Mercère, P.; Da Silva, P.; Orsini, F.; Menneglier, C.; Jaouen, N.

doi:10.1107/S160057752001262X

Journal of Synchrotron Radiation Journal of
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Figure 13
SEXTANTS beamline synoptic for the GSENSE400BSI versus CCD test. In the top left, a scanning electron microscopy (SEM) image of the Co/Cu nanostructured sample used for the test.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 27| Part 6| November 2020| Pages 1577-1589

https://doi.org/10.1107/S160057752001262X

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