Backside-illuminated scientific CMOS detector for soft X-ray resonant scattering and ptychography

Desjardins, K.; Medjoubi, K.; Sacchi, M.; Popescu, H.; Gaudemer, R.; Belkhou, R.; Stanescu, S.; Swaraj, S.; Besson, A.; Vijayakumar, J.; Pautard, S.; Noureddine, A.; Mercère, P.; Da Silva, P.; Orsini, F.; Menneglier, C.; Jaouen, N.

doi:10.1107/S160057752001262X

Journal of Synchrotron Radiation Journal of
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Figure 5
Circular integration of a pinhole diffraction image from sCMOS GSENSE400BSI-TVISB obtained at 186 eV on the METROLOGIE beamline. Top right: the 100 accumulations of 100 ms dark-corrected images in HDR mode.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 27| Part 6| November 2020| Pages 1577-1589

https://doi.org/10.1107/S160057752001262X

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