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Figure 6
MTF calculation from sCMOS GSENSE400BSI-TVISB slanted edge image at 1500 eV on the METROLOGIE beamline (1000 accumulations of dark-corrected images of 100 ms). |
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Figure 6
MTF calculation from sCMOS GSENSE400BSI-TVISB slanted edge image at 1500 eV on the METROLOGIE beamline (1000 accumulations of dark-corrected images of 100 ms). |