Backside-illuminated scientific CMOS detector for soft X-ray resonant scattering and ptychography

Desjardins, K.; Medjoubi, K.; Sacchi, M.; Popescu, H.; Gaudemer, R.; Belkhou, R.; Stanescu, S.; Swaraj, S.; Besson, A.; Vijayakumar, J.; Pautard, S.; Noureddine, A.; Mercère, P.; Da Silva, P.; Orsini, F.; Menneglier, C.; Jaouen, N.

doi:10.1107/S160057752001262X

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Figure 7
(a) Example of image analysed for X-ray energy beam of 1000 eV (blue circles are the pixels extracted). (b) Spectra of single-event frequencies for X-ray photon energy of 100–1500 eV. The spectra for 400–1500 eV have been manually cropped in the low-energy range (down to 200 eV).

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 27| Part 6| November 2020| Pages 1577-1589

https://doi.org/10.1107/S160057752001262X

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