Bent crystal Laue analyser combined with total reflection fluorescence X-ray absorption fine structure (BCLA + TRF-XAFS) and its application to surface studies

Wakisaka, Y.; Hu, B.; Kido, D.; Al Rashid, M.H.; Chen, W.; Dong, K.; Wada, T.; Bharate, B.; Yuan, Q.; Mukai, S.; Takeichi, Y.; Takakusagi, S.; Asakura, K.

doi:10.1107/S1600577520011170

Journal of Synchrotron Radiation Journal of
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Figure 1
Schematic of the TRF-XAFS system. The incident X-rays come from the left side and the fluorescent X-rays are analysed by BCLA. The BCLA is covered with a lead sheet, except for its entrance and exit windows.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 27| Part 6| November 2020| Pages 1618-1625

https://doi.org/10.1107/S1600577520011170

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