Bent crystal Laue analyser combined with total reflection fluorescence X-ray absorption fine structure (BCLA + TRF-XAFS) and its application to surface studies

Wakisaka, Y.; Hu, B.; Kido, D.; Al Rashid, M.H.; Chen, W.; Dong, K.; Wada, T.; Bharate, B.; Yuan, Q.; Mukai, S.; Takeichi, Y.; Takakusagi, S.; Asakura, K.

doi:10.1107/S1600577520011170

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Figure 6
(a) Photon energy dependence of the total excitation X-ray intensity (I_t) with various critical angles (a)–(g) calculated based on the atomic scattering factors (Gullikson, 2001

; Henke et al., 1993

; Nelson et al., 1994

). (h) Photon energy dependence of the critical angle.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 27| Part 6| November 2020| Pages 1618-1625

https://doi.org/10.1107/S1600577520011170

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