view article
Figure 3
(a) IXRF(E) for three polystyrene samples overlaid with fits to equation (2)[link]. Intensity has been scaled with the measured relative responsivity reported in Section 4[link] and is presented in units of sterad−1. Intensity has been processed according to equation (2)[link] and is presented in units of (ADU nA−1). Thicknesses were measured when the sample was rotated by 45° so the true thickness is lower by a factor of [\sqrt2.] The top graph of (a) presents the normalized residue (norm res) as discussed in the main text. (b) RSOXS intensity reported by the CCD detector for a single polystyrene sample (t = 227 nm). Dashed lines represent the XRF background from the measurements in part (a).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 27| Part 6| November 2020| Pages 1601-1608
https://doi.org/10.1107/S1600577520011066
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS