Improving the soft X-ray reflectivity of Cr/Ti multilayers by co-deposition of B4C

Zhu, J.; Zhang, J.; Li, H.; Tu, Y.; Chen, J.; Wang, H.; Dhesi, S.S.; Cui, M.; Zhu, J.; Jonnard, P.

doi:10.1107/S1600577520011741

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Figure 2
(a) B 1s and (b) C 1s XPS spectra of the B₄C monolayer and Cr/Ti multilayer with B₄C. Open symbols represent the measured data, solid lines the fitted spectra, short dashed lines the background, and long dashed lines the peaks used in the fitting if more than one peak is involved.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 27| Part 6| November 2020| Pages 1614-1617

https://doi.org/10.1107/S1600577520011741

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