Improving the soft X-ray reflectivity of Cr/Ti multilayers by co-deposition of B4C

Zhu, J.; Zhang, J.; Li, H.; Tu, Y.; Chen, J.; Wang, H.; Dhesi, S.S.; Cui, M.; Zhu, J.; Jonnard, P.

doi:10.1107/S1600577520011741

Journal of Synchrotron Radiation Journal of
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Figure 5
Soft X-ray reflectivity of the Cr/Ti multilayers with and without B₄C. Solid lines represent the measured data and dashed lines show the calculated reflectivities.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 27| Part 6| November 2020| Pages 1614-1617

https://doi.org/10.1107/S1600577520011741

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