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Figure 5
Comparison between the cross section of a rectangular source with height a = 50 µm and width b = 100 µm (outlined with dashed lines) and its back-traced virtual appearance (outlined with solid lines) at the original source position after off-plane diffraction in the condition presented in Figs. 1[link]–4[link]. The diffraction is assumed to have taken place in a single point at the grating for which an inclination of its surface by α = 29.5° is assumed. Both cross sections are plotted symmetrically with respect to their centres. The angle φ is the inclination angle between the sides of the parallelogram according to equation (4)[link].

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 27| Part 6| November 2020| Pages 1499-1509
https://doi.org/10.1107/S1600577520011194
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