addenda and errata
Determination of X-ray
via intensity correlation measurement of ErratumaRIKEN SPring-8 Center, 1-1-1, Kouto, Sayo, Hyogo 679-5148, Japan, and bJapan Synchrotron Radiation Research Institute, 1-1-1 Kouto, Sayo, Hyogo 679-5198, Japan
*Correspondence e-mail: inoue@spring8.or.jp
Corrections to equations and experimental results in the paper by Inoue et al. [(2019). J. Synchrotron Rad. 26, 2050–2054] are made.
The correct versions of equations (2) and (3) in the paper by Inoue et al. (2019) are as follows:
The additional factors of 1/2 on the right-hand sides of these equations represent a decrease in intensity correlation of et al., 2020; Goodman, 2007).
due to the unpolarized nature of the fluorescence (TrostAccordingly, the degree of intensity correlation [g0(2)] and the XFEL duration [] evaluated by the experiment also need to be corrected; the values of g0(2) and shown in Section 4 should be 0.0262 ± 0.008 and 5.1 ± 0.2 fs, respectively. The determined XFEL duration is consistent with previous estimations by other methods (Inubushi et al., 2017; Inoue et al., 2018), in which the XFEL duration was evaluated to be less than 10 fs. Although the determined XFEL duration is shorter than the electron bunch duration measured by a radiofrequency deflector (∼10 fs in FWHM), such discrepancy could be explained by insufficient time resolution of the deflector (∼10 fs) (Ego et al., 2015).
Acknowledgements
We thank the authors of Trost et al. (2020) for pointing out the errors in the original paper.
References
Ego, H., Maesaka, H., Sakurai, T., Otake, Y., Hashirano, T. & Miura, S. (2015). Nucl. Instrum. Methods Phys. Res. A, 795, 381–388. Web of Science CrossRef CAS Google Scholar
Goodman, J. W. (2007). Speckle Phenomena in Optics: Theory and Applications. Englewood: Roberts and Co. Google Scholar
Inoue, I., Hara, T., Inubushi, Y., Tono, K., Inagaki, T., Katayama, T., Amemiya, Y., Tanaka, H. & Yabashi, M. (2018). Phys. Rev. Accel. Beams, 21, 080704. Web of Science CrossRef Google Scholar
Inoue, I., Tamasaku, K., Osaka, T., Inubushi, Y. & Yabashi, M. (2019). J. Synchrotron Rad. 26, 2050–2054. Web of Science CrossRef IUCr Journals Google Scholar
Inubushi, Y., Inoue, I., Kim, J., Nishihara, A., Matsuyama, S., Yumoto, H., Koyama, T., Tono, K., Ohashi, H., Yamauchi, K. & Yabashi, M. (2017). Appl. Sci. 7, 584. Web of Science CrossRef Google Scholar
Trost, F., Ayyer, K. & Chapman, H. (2020). New J. Phys. 22, 083070. CrossRef Google Scholar
© International Union of Crystallography. Prior permission is not required to reproduce short quotations, tables and figures from this article, provided the original authors and source are cited. For more information, click here.