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Figure 1
(a) A schematic diagram of the Si plate. The geometric arrangement of the X-ray primary beam, the plate rotation axis and the reciprocal-lattice vector of the crystal is drawn. (b) A schematic diagram of the Bond diffractometer. (c) A schematic diagram of the beamline. HHM is the high heat-load monochromator, HRM is the high-resolution monochromator, IC is the ionization chamber and θB the Bragg angle. The X-ray beam, shown as the orange lines, comes in from the left-hand side and passes through the Si plate in each panel. The diffracted beams are indicated by thin orange lines. In panels (b) and (c), the Si plate is rotated by the Bragg angle from the angle perpendicular to the beam, and one PIN photodiode receives the diffracted beam.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 28| Part 1| January 2021| Pages 111-119
https://doi.org/10.1107/S1600577520014526
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