Absolute X-ray energy measurement using a high-accuracy angle encoder

Masuda, T.; Watanabe, T.; Beeks, K.; Fujimoto, H.; Hiraki, T.; Kaino, H.; Kitao, S.; Miyamoto, Y.; Okai, K.; Sasao, N.; Seto, M.; Schumm, T.; Shigekawa, Y.; Tamasaku, K.; Uetake, S.; Yamaguchi, A.; Yoda, Y.; Yoshimi, A.; Yoshimura, K.

doi:10.1107/S1600577520014526

Journal of Synchrotron Radiation Journal of
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Figure 4
(Top) The X-ray diffraction peak measured on one side. The horizontal axis is the Si plate rotation angle controlled by SelfA, and the vertical axis is the output current from the PIN photodiode. (Bottom) The residual plot of the upper figure.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 28| Part 1| January 2021| Pages 111-119

https://doi.org/10.1107/S1600577520014526

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