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Figure 1
(a) Distribution of the diffracted peaks intercepting the CCD camera together with their Bragg indexes using the CdTe unit cell. (b) Schematic showing how bi-axial strain [\epsilon_{{zz}}] changes the X component [X_{{\alpha}}] of the unstrained (in black) peak position into the strained (in red) X component [X_{{\alpha^{\,\prime}}}] = [(1+\epsilon_{{zz}})X_{{\alpha}}] since it induces a diffraction plane rotation [\alpha\rightarrow\alpha^{\,\prime}] = [(1+\epsilon_{{zz}})\,\alpha] in the (X,Z) plane.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 28| Part 1| January 2021| Pages 181-187
https://doi.org/10.1107/S1600577520013211
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