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Figure 2
For the annealed sample, panel (a) shows selected peak displacements along X as a function of depth relative to the layer/substrate interface, the reference being placed 50 µm deep into the CdZnTe substrate. Panels (b), (c) and (d) are plots of peak displacement as a function of their position on the camera for the three zones marked as 1, 2 and 3 in (a) and, corresponding to the HgCdTe layer, the layer/substrate interface and the CdZnTe substrate, respectively.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 28| Part 1| January 2021| Pages 181-187
https://doi.org/10.1107/S1600577520013211
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